1. Kelvin probe force microscopy :
پدیدآورنده : Sascha Sadewasser, Thilo Glatzel, editors.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Atomic force microscopy.,Electrostatics-- Measurement.,Scanning probe microscopy.,Materials science.,Materials science.,Measurement.,Mensuration & systems of measurement.,Microscopy.,Nanotechnology.,Physical measurements.,Physics.,Precision instruments manufacture.,SCIENCE-- General.,Spectrum analysis, spectrochemistry, mass spectrometry.,Spectrum analysis.,Surfaces (Technology),Testing of materials.,Thin films.
رده :
QH212
.
A78
K45
2018
2. Nanoindentation /
پدیدآورنده : Anthony C. Fischer-Cripps
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Materials-- Testing,Nanotechnology,Surfaces (Technology)-- Testing,Thin films
رده :
T174
.
7
.
F57
2011
3. Residual stresses and nanoindentation testing of films and coatings /
پدیدآورنده : by Haidou Wang, Lina Zhu, Binshi Xu.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Continuum mechanics.,Materials science.,Nanotechnology.,Residual stresses.,Surfaces (Technology),Thin films.,Continuum mechanics.,Materials science.,Nanotechnology.,Residual stresses.,Surfaces (Technology),TECHNOLOGY & ENGINEERING-- Engineering (General),TECHNOLOGY & ENGINEERING-- Reference.,Thin films.
رده :
TA404
.
6
